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VLSI Design and Test|Brajesh Rawat

VLSI Design and Test : 29th International Symposium, Vdat 2025, Chandigarh, India, August 7-9, 2025, Proceedings, Part I

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Overview

This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7-9, 2025.

The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures.

This item is Non-Returnable

Details

  • ISBN-13: 9783032263049
  • ISBN-10: 3032263042
  • Publisher: Springer
  • Publish Date: November 2026
  • Page Count: 574

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