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"item_title" : "VLSI Design and Test",
"item_author" : [" Brajesh Rawat", "Hitesh Shirmali", "Shivani Malhotra "],
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VLSI Design and Test : 29th International Symposium, Vdat 2025, Chandigarh, India, August 7-9, 2025, Proceedings, Part I
Overview
This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7-9, 2025.
The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures.
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Details
- ISBN-13: 9783032263049
- ISBN-10: 3032263042
- Publisher: Springer
- Publish Date: November 2026
- Page Count: 574
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