{
"item_title" : "X-Ray Microscopy and Spectromicroscopy",
"item_author" : [" Jürgen Thieme", "Günter Schmahl", "Dietbert Rudolph "],
"item_description" : "This book appeals to reseachers developing and/or using the new and important technique of X-ray microscopy. The subject is treated systematically in the book, which gives a status report on this analytical technique. The variety of applications is presented on the enclosed CD.",
"item_img_path" : "https://covers4.booksamillion.com/covers/bam/3/64/272/108/3642721087_b.jpg",
"price_data" : {
"retail_price" : "54.99", "online_price" : "54.99", "our_price" : "54.99", "club_price" : "54.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : ""
}
}
X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996
Overview
This book appeals to reseachers developing and/or using the new and important technique of X-ray microscopy. The subject is treated systematically in the book, which gives a status report on this analytical technique. The variety of applications is presented on the enclosed CD.
This item is Non-Returnable
Customers Also Bought
Details
- ISBN-13: 9783642721083
- ISBN-10: 3642721087
- Publisher: Springer
- Publish Date: August 2014
- Dimensions: 9.21 x 6.14 x 0.84 inches
- Shipping Weight: 1.25 pounds
- Page Count: 383
Related Categories
