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{ "item_title" : "Yield and Reliability in Microwave Circuit and System Design", "item_author" : [" Michael D. Meehan", "John Purviance", "Michael D. Meehan "], "item_description" : "This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/0/89/006/527/0890065276_b.jpg", "price_data" : { "retail_price" : "107.00", "online_price" : "107.00", "our_price" : "107.00", "club_price" : "107.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Yield and Reliability in Microwave Circuit and System Design|Michael D. Meehan

Yield and Reliability in Microwave Circuit and System Design

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Overview

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

This item is Non-Returnable

Details

  • ISBN-13: 9780890065273
  • ISBN-10: 0890065276
  • Publisher: Artech House Publishers
  • Publish Date: December 1993
  • Dimensions: 9.34 x 6.25 x 0.84 inches
  • Shipping Weight: 1.29 pounds
  • Page Count: 300

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