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"item_description" : "Introduction Fundamentals of Defect Ionization and Transport Experimental and Computational Characterization Trends in Charged Defect Behavior Intrinsic Defects: Structure Intrinsic Defects: Ionization Thermodynamics Intrinsic Defects: Diffusion Extrinsic Defects",
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Charged Semiconductor Defects : Structure, Thermodynamics and Diffusion
Overview
Introduction Fundamentals of Defect Ionization and Transport Experimental and Computational Characterization Trends in Charged Defect Behavior Intrinsic Defects: Structure Intrinsic Defects: Ionization Thermodynamics Intrinsic Defects: Diffusion Extrinsic Defects
This item is Non-Returnable
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Details
- ISBN-13: 9781848820586
- ISBN-10: 1848820585
- Publisher: Springer
- Publish Date: December 2008
- Dimensions: 9.4 x 6.4 x 1 inches
- Shipping Weight: 1.4 pounds
- Page Count: 298
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