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Electron and Ion Microscopy and Microanalysis|Lawrence E. Murr

Electron and Ion Microscopy and Microanalysis : Principles and Applications, Second Edition,

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Overview

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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Details

  • ISBN-13: 9780367402945
  • ISBN-10: 0367402947
  • Publisher: CRC Press
  • Publish Date: October 2019
  • Dimensions: 9.9 x 6.9 x 1.9 inches
  • Shipping Weight: 3.2 pounds
  • Page Count: 856

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