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"item_title" : "MOS Interface Physics, Process and Characterization",
"item_author" : [" Shengkai Wang", "Xiaolei Wang "],
"item_description" : "The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.",
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MOS Interface Physics, Process and Characterization
by Shengkai Wang and Xiaolei Wang
Other Available Formats
Overview
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
This item is Non-Returnable
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Details
- ISBN-13: 9781032106274
- ISBN-10: 1032106271
- Publisher: CRC Press
- Publish Date: October 2021
- Dimensions: 9 x 6 x 0.44 inches
- Shipping Weight: 0.89 pounds
- Page Count: 162
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