{ "item_title" : "Models in Hardware Testing", "item_author" : [" Hans-Joachim Wunderlich "], "item_description" : "Contributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond.1. Open Defects in Nanometer Technologies; J. Figueras, R. Rodr guez-Monta s, D. Arum2. Models for Bridging Defects; M. Renovell, F. Azais, J. Figueras, R. Rodriguez-Montanes, D. Arumi3. Models for Delay Faults; S.M. Reddy4. Fault Modeling for Simulation and ATPG; B.Becker, I.Polian5. Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst6. Models in Memory Testing; S.Di Carlo, P.Prinetto7. Models for Power-Aware Testing; P.Girard, H.-J.Wunderlich8. Physical Fault Models and Fault Tolerance; J.Arlat, Y.CrouzetIndex.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/9/04/813/281/9048132819_b.jpg", "price_data" : { "retail_price" : "109.99", "online_price" : "109.99", "our_price" : "109.99", "club_price" : "109.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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