Overview
Science and Technology in the Twenty-First Century.- Scanning Tunneling Microscopy.- Atomic Force Microscopy.- Near-Field Scanning Optical Microscope.- Scanning Capacitance Microscope.- Electrostatic Force Microscopy.- Magnetic Force Microscope.- STM-Induced Photon Emission Spectroscopy.- Scanning Atom Probe.- Chemical Discrimination of Atoms and Molecules.- Manipulation of Atoms and Molecules.- Multiprobe SPM.- AFM Measurement in Liquid.- High-Speed SPM.- Scanning Nonlinear Dielectric Microscope.- SPM Coupled with External Fields.- Probe Technology.- Characterization of Semiconducting Materials.- Evaluation of SPM for LSI Devices.- SPM Characterization of Catalysts.- SPM Characterization of Biomaterials.- SPM Characterization of Organic and Polymeric Materials.- Theories of SPM.- When Will SPM Realize Our Dreams? The Roadmap of SPM.
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Details
- ISBN-13: 9783642070693
- ISBN-10: 3642070698
- Publisher: Springer
- Publish Date: November 2010
- Dimensions: 9.21 x 6.14 x 0.46 inches
- Shipping Weight: 0.69 pounds
- Page Count: 201
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