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{
"item_title" : "VLSI Design and Test",
"item_author" : [" Brajesh Kumar Kaushik", "Sudeb Dasgupta", "Virendra Singh "],
"item_description" : "Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.",
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VLSI Design and Test : 21st International Symposium, Vdat 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
Overview
Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.
This item is Non-Returnable
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Details
- ISBN-13: 9789811074691
- ISBN-10: 9811074690
- Publisher: Springer
- Publish Date: December 2017
- Dimensions: 9.21 x 6.14 x 1.67 inches
- Shipping Weight: 2.54 pounds
- Page Count: 815
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