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VLSI Design and Test|S. Rajaram

VLSI Design and Test : 22nd International Symposium, Vdat 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

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Overview

Digital design.- Analog and mixed signal design.- Hardware security.- Micro bio-fluidics.- VLSI testing.- Analog circuits and devices.- Network-on-chip.- Memory.- Quantum computing and NoC.- Sensors and interfaces.

This item is Non-Returnable

Details

  • ISBN-13: 9789811359491
  • ISBN-10: 9811359490
  • Publisher: Springer
  • Publish Date: January 2019
  • Dimensions: 9.21 x 6.14 x 1.48 inches
  • Shipping Weight: 2.25 pounds
  • Page Count: 722

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