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"item_title" : "VLSI Test Principles and Architectures",
"item_author" : [" Laung-Terng Wang", "Cheng-Wen Wu", "Xiaoqing Wen "],
"item_description" : "This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.",
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VLSI Test Principles and Architectures : Design for Testability
Other Available Formats
Overview
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
This item is Non-Returnable
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Details
- ISBN-13: 9780123705976
- ISBN-10: 0123705975
- Publisher: Morgan Kaufmann Publishers
- Publish Date: June 2006
- Dimensions: 9.38 x 8.12 x 2.06 inches
- Shipping Weight: 3.92 pounds
- Page Count: 808
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