X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
Overview
This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
This item is Non-Returnable
Customers Also Bought
Details
- ISBN-13: 9783540201793
- ISBN-10: 3540201793
- Publisher: Springer
- Publish Date: January 2004
- Dimensions: 9.4 x 6.3 x 0.7 inches
- Shipping Weight: 1.15 pounds
- Page Count: 204
Related Categories
