{ "item_title" : "X-Ray Line Profile Analysis in Materials Science", "item_author" : [" Jenő Gubicza "], "item_description" : "X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.", "item_img_path" : "https://covers4.booksamillion.com/covers/bam/1/46/665/852/1466658525_b.jpg", "price_data" : { "retail_price" : "215.00", "online_price" : "215.00", "our_price" : "215.00", "club_price" : "215.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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