{ "item_title" : "Scanning Microscopy for Nanotechnology", "item_author" : [" Weilie Zhou", "Zhong Lin Wang "], "item_description" : "Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.", "item_img_path" : "https://covers3.booksamillion.com/covers/bam/1/44/192/209/1441922091_b.jpg", "price_data" : { "retail_price" : "249.99", "online_price" : "249.99", "our_price" : "249.99", "club_price" : "249.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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